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學術成果

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期刊論文
學年度97
論文名稱(篇名)Increasing Detectability in Semiconductor Foundry by Multivariate Statistical Process Control
期刊名Total Quality Management & Business Excellence 19(5), pp.429-440
出版日期2008-06-01
作者中文名牛涵錚
作者英文名HAN-JEN NIU
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